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A Synthetic Control Chart for Detecting Fraction Nonconforming Increases

机译:用于检测分数不合格增长的综合控制图

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In this paper we propose a new control chart, the synthetic control chart, for the detection of increases in the fraction nonconforming (p). The operation, design, and performance of this control chart are described. The synthetic chart is a combination of the np chart and the conforming run length chart. It provides the user with some freedom in adjusting the control chart parameters so that the out-of-control average time to signal can be minimized. Numerical tests have indicated that the synthetic chart has a higher power for detecting process shifts in the fraction nonconforming than both the np chart and the conforming run length chart. The improvement is significant for all cases, resulting in a 50 percent or greater reduction of the out-of-control average time to signal. The application of the synthetic chart may therefore substantially enhance the effectiveness of statistical process control for attributes.
机译:在本文中,我们提出了一个新的控制图,即合成控制图,用于检测分数不合格(p)的增加。描述了此控制图的操作,设计和性能。合成图是np图和合格运行长度图的组合。它为用户提供了调整控制图参数的自由度,因此可以将信号失控的平均时间降至最低。数值测试表明,合成图表具有比np图和合格运行长度图表更高的检测不合格分数中的工艺偏移的能力。对于所有情况而言,这种改善都是显着的,从而使失控平均发信号时间减少了50%或更多。因此,合成图表的应用可以大大增强属性的统计过程控制的有效性。

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