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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Angle-resolved x-ray imaging using a resolution-tunable double-crystal analyser
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Angle-resolved x-ray imaging using a resolution-tunable double-crystal analyser

机译:使用分辨率可调的双晶体分析仪进行角分辨X射线成像

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A resolution-tunable double-crystal analyser was successfully applied, for the first time, to angle-resolved x-ray imaging. Tuning the resolution between 0.5" and 2.3" was done with small loss of peak intensity using a Si(220) double-crystal analyser. The angle-resolved images of a housefly were recorded on nuclear emulsion plates at various angular resolutions. Several methods to improve the angular resolution of the analyser are also proposed. [References: 10]
机译:分辨率可调的双晶分析仪首次成功应用于角度分辨X射线成像。使用Si(220)双晶体分析仪在0.5“和2.3”之间调节分辨率,并且峰值强度损失很小。家蝇的角分辨图像以各种角分辨率记录在核乳剂板上。还提出了几种提高分析仪角度分辨率的方法。 [参考:10]

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