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首页> 外文期刊>Journal of optoelectronics and advanced materials >Dip and spin coated nanoscale transparent PMMA thin films for field effect thin film transistors and optoelectronic devices
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Dip and spin coated nanoscale transparent PMMA thin films for field effect thin film transistors and optoelectronic devices

机译:浸涂和旋涂纳米级透明PMMA薄膜,用于场效应薄膜晶体管和光电器件

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摘要

Polymethylmethacrylate (PMMA) is one of the promising and useful polymer material and there are numerous proposals for its application in field effect thin films transistors and opto-electronic devices. Nanoscale PMMA films are prepared by dip and spin coating techniques. The FTIR analysis indicated the absence of any impurity in the dip and spin coated films. The XRD analysis of as grown and annealed films indicated amorphous nature. The SEM analysis revealed the phenomenon of self assembly on the mesocopic scale without pits and pin holes on the surface. The optical band gap determined from Tauc's plot has been found to be 3.79 eV and 3.78 eV for as grown and annealed dip coating, 3.79 eV and 3.76 eV for as grown and annealed films prepared by spin coating. The dielectric behaviour of Al/PMMA/Al sandwich structure was carried out by using LCR meter. The observed amorphous structure, smooth surface, high transmittance and dielectric properties indicated that the prepared nanoscale transparent PMMA films could be used as opto-electronic devices and high k dielectric in organic field effect thin film transistors.
机译:聚甲基丙烯酸甲酯(PMMA)是一种很有前途且有用的聚合物材料,在场效应薄膜晶体管和光电器件中有许多建议。纳米级PMMA膜是通过浸涂和旋涂技术制备的。 FTIR分析表明在浸涂和旋涂膜中没有任何杂质。生长和退火后的薄膜的XRD分析表明其为非晶态。 SEM分析揭示了介观尺度上的自组装现象,其表面上没有凹坑和针孔。由Tauc曲线确定的光学带隙对于经生长和退火的浸涂而言为3.79eV和3.78eV,对于通过旋涂制备的经生长和退火的膜而言为3.79eV和3.76eV。 Al / PMMA / Al夹心结构的介电性能是通过LCR仪进行的。观察到的无定形结构,光滑的表面,高透射率和介电性能表明,所制备的纳米级透明PMMA薄膜可以用作光电器件和高k介电常数的有机场效应薄膜晶体管。

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