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首页> 外文期刊>Journal of optoelectronics and advanced materials >Preparation and characterization of Copper/Nikel nanostructurated multilayers using thermionic vacuum Arc method
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Preparation and characterization of Copper/Nikel nanostructurated multilayers using thermionic vacuum Arc method

机译:热离子真空电弧法制备铜/镍纳米结构多层膜及其表征

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摘要

Copper and nickel multilayers were prepared in order to obtain nanostructured giant magnetoresistive (GMR) thin films. In this respect we followed the original method of thermionic vacuum arc (TVA), which uses an external source of electrons for the creation of both metal vapors and metal ions. The low arc currents used in this case allow gentle evaporation of the anode material, which results in high smoothness of the films. The deposition thicknesses were controlled to be of 2.5-10 nm for Cu and 4-10 nm for Ni, using a Cressington quartz balance monitor. Morphology and structure of the prepared films were analyzed using electron microscopy techniques (transmission electron and scanning electron microscopy, energy dispersive X-ray spectroscopy). The thickness of the Cu layer influence on the properties of the prepared film was inferred in correlation with giant magneto-resistive effect.
机译:制备铜和镍多层以获得纳米结构的巨磁阻(GMR)薄膜。在这方面,我们采用了热电子真空电弧(TVA)的原始方法,该方法使用外部电子源来产生金属蒸气和金属离子。在这种情况下使用的低电弧电流允许阳极材料温和地蒸发,这导致膜的高平滑度。使用Cressington石英平衡监视器将沉积厚度控制为Cu为2.5-10 nm,Ni为4-10 nm。使用电子显微镜技术(透射电子和扫描电子显微镜,能量色散X射线光谱法)分析了所制备膜的形态和结构。推测铜层的厚度对所制备的膜的性能有影响,并与巨磁阻效应相关。

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