Characterization of a dye doped planar polymer waveguide by leakage radiation microscopy

摘要

Leakage radiation microscopy (LRM) is extended to the characterization of dye doped planar polymer waveguide modes (WMs) rather than surface plasmon polaritons (SPPs). We mainly focus on how to measure the propagation lengths of the WMs excited by the fluorescence from the dye molecules. Numerical simulations are also carried out to calculate the propagation lengths of these modes and are consistent with experimental results.