...
首页> 外文期刊>Journal of optics, A. Pure and applied optics: journal of the European Optical Society >Investigation of an optical method for determining the average radius of curvature of micro-optical lenticular lens arrays
【24h】

Investigation of an optical method for determining the average radius of curvature of micro-optical lenticular lens arrays

机译:确定微光学双凸透镜阵列平均曲率半径的光学方法的研究

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Micro-optical elements are of great importance in areas of optoelectronics and informationprocessing. Establishing fast, reliable methods for characterization and quality control of theseelements is important in order to maintain the optical performance in a high volume productionprocess. We investigate an optical technique, applied to a polymer-based, injection moulded,lenticular array, but the method is also applicable for the tooling for these elements. Thecylindrical lenses have feature sizes of 1-15 rm. The method is based on observation of theintensity distribution, which can be obtained in the far field of surface reflections resulting froma plane wave incident on the lenticular array. The intensity distribution of the diffraction ordersis highly correlated with the shape of the illuminated lenslets. This is exploited to attaininformation about possible defects and shape variations that have arisen in the mouldingprocess. The experimental results are compared with a model, based on the Fraunhoferapproximation to the Huygens—Fresnel principle. Furthermore, the optical elements underinvestigation are probed using a scanning probe microscope. Hence, access to accuratetopological data of the elements is attained and used to confirm the validity of the proposedoptical technique.
机译:微光学元件在光电子学和信息处理领域非常重要。建立快速,可靠的表征和质量控制这些元素的方法对于在大批量生产过程中保持光学性能很重要。我们研究了一种光学技术,该技术已应用于基于聚合物的注射成型双凸透镜阵列,但该方法也适用于这些元件的加工。圆柱透镜的特征尺寸为1-15 rm。该方法基于对强度分布的观察,该强度分布可以在由入射在双凸透镜阵列上的平面波产生的表面反射的远场中获得。衍射阶数的强度分布与照明小透镜的形状高度相关。以此来获得有关成型过程中可能出现的缺陷和形状变化的信息。将实验结果与基于惠更斯-菲涅耳原理的弗劳恩霍夫近似的模型进行比较。此外,使用扫描探针显微镜对未调查的光学元件进行探测。因此,可以获得对元件的准确拓扑数据的访问,并用于确认所提出的光学技术的有效性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号