Forced scanning-a method for improving linearity of static performance in optoelectronic position sensors

摘要

We discuss a method for achieving linearity of static performance in an optoelectronic system for determining the position of a source via relative movement of the image of a small emission source relative to the sight line to the source; this approach increases the accuracy with which the coordinates of such sighting targets can be determined. (C) 2016 Optical Society of America.