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首页> 外文期刊>Journal of nanoparticle research: An interdisciplinary forum for nanoscale science and technology >Aerosol emission monitoring in the production of silicon carbide nanoparticles by induction plasma synthesis
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Aerosol emission monitoring in the production of silicon carbide nanoparticles by induction plasma synthesis

机译:感应等离子体合成生产碳化硅纳米颗粒中的气溶胶排放监测

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In this study, the synthesis of silicon carbide (SiC) nanoparticles in a prototype inductively coupled thermal plasma reactor and other supporting processes, such as the handling of precursor material, the collection of nanoparticles, and the cleaning of equipment, were monitored for particle emissions and potential worker exposure. The purpose of this study was to evaluate the effectiveness of engineering controls and best practice guidelines developed for the production and handling of nanoparticles, identify processes which result in a nanoparticle release, characterize these releases, and suggest possible administrative or engineering controls whichmay eliminate or control the exposure source. No particle release was detected during the synthesis and collection of SiC nanoparticles and the cleaning of the reactor. This was attributed to most of these processes occurring in closed systems operated at slight underpressure. Other tasks occurring in more open spaces, such as the disconnection of a filter assembly from the reactor system and the use of compressed air for the cleaning of filters where synthesized SiC nanoparticles were collected, resulted in releases of submicrometer particles with a mode size of~170-180 nm. Observation of filter samples under scanning electron microscope confirmed that the particles were agglomerates of SiC nanoparticles.
机译:在这项研究中,监测了原型感应耦合热等离子体反应器中的碳化硅(SiC)纳米颗粒的合成以及其他支持过程,例如前体材料的处理,纳米颗粒的收集和设备的清洁,以监测颗粒排放和潜在的工人风险。这项研究的目的是评估为生产和处理纳米颗粒而开发的工程控制和最佳实践准则的有效性,确定导致纳米颗粒释放的过程,表征这些释放,并提出可能消除或控制的可能的行政或工程控制措施曝光源。在SiC纳米颗粒的合成和收集以及反应器的清洁过程中未检测到颗粒释放。这归因于这些过程中的大多数发生在轻微负压下运行的封闭系统中。在更开放的空间中发生的其他任务,例如将过滤器组件与反应器系统断开连接以及使用压缩空气来清洁收集合成的SiC纳米颗粒的过滤器,导致释放出模式尺寸为〜的亚微米颗粒。 170-180 nm。在扫描电子显微镜下观察过滤器样品,证实该颗粒是SiC纳米颗粒的附聚物。

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