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Quantitative characterization of fracture surface roughness using secondary electron line scanning method

机译:二次电子线扫描法定量表征断裂表面粗糙度

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摘要

Secondary electron line scanning (SELS), which acts as an effective and convenient way of characterizing the fracture surface quantitatively, has been attracting substantial interest. Pande et til. [1,2] have postulated that the scanning profile from a fracture surface in scanning electron microscopy (SEM) can be employed to measure the fractal dimension. Huang et cil. [3,4] also made a study on this method and verified its feasibility.
机译:二次电子线扫描(SELS)作为定量表征断裂表面的一种有效而便捷的方式,引起了人们的极大兴趣。 Pande等。 [1,2]假定可以使用扫描电子显微镜(SEM)中来自断裂表面的扫描轮廓来测量分形维数。黄等[3,4]也对该方法进行了研究,并验证了其可行性。

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