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首页> 外文期刊>Journal of manufacturing science and engineering: Transactions of the ASME >Laser Bending of Silicon Sheet: Absorption Factor and Mechanisms
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Laser Bending of Silicon Sheet: Absorption Factor and Mechanisms

机译:硅片的激光弯曲:吸收因子和机理

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摘要

Laser bending of silicon sheet is a process to form three-dimensional microstructural silicon elements in an ambient environment. This study aims to investigate the process mechanism with the aid of both experimental and numerical analyses. To this end, a thin-film thermocouple was prepared to capture the temperature field within the heating zone of the laser beam. A new method was then developed to precisely determine the absorption factor by coupling numerical simulation of the laser bending results with the experimental results. It was found that each laser pulse causes a cycle of sharp temperature rise-drop in a silicon sheet. When the temperature in the heating zone is low, the sheet deforms elastically. When it is beyond the brittle-ductile transition temperature of silicon, however, plastic deformation in the sheet takes place and bending occurs. The bending angle becomes larger with increasing the number of laser beam scanning, once the temperature gradient in the scanning area is large enough.
机译:硅片的激光弯曲是在周围环境中形成三维微结构硅元素的过程。这项研究旨在借助实验和数值分析来研究过程机理。为此,准备了薄膜热电偶以捕获激光束加热区内的温度场。然后开发了一种新方法,通过将激光弯曲结果的数值模拟与实验结果相结合来精确确定吸收系数。已经发现,每个激光脉冲在硅片中引起急剧的温度上升-下降循环。当加热区域中的温度低时,片材弹性变形。然而,当其超过硅的脆性-延性转变温度时,片材中发生塑性变形并发生弯曲。一旦扫描区域中的温度梯度足够大,弯曲角度就会随着激光束扫描次数的增加而变大。

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