Structural Refinements on Restricted Intensity Data Collected in High-Pressure Diffraction Experiments

摘要

The quality of the X-ray diffraction data collected for single crystal in high-pressure environment, generated using a diamond anvil cell (DAC), is the net effect of several factors including high background level, absorption and extinction of the beam by diamond anvils, absorption of beryllium disks, overlaying reflections from the sample and grains in the beryllium disks, gasket and reference crystal. One of important restrictions is the limited access to the reciprocal space imposed by the steel elements of the DAC. We investigated the influence of this factor on the structural data refinement.