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A Capacitance Sensor for Two-Phase Liquid Film Thickness Measurements in a Square Duct

机译:用于方形管道中两相液膜厚度测量的电容传感器

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The use of capacitance sensors for measuring liquid film thickness or phase concentration in two-phase flow has gained popularity in recent years. In designing 1 sensors, there are many issues which must be considered in order to optimize performance: desired temporal and spatial resolution, two-phase flow regime, permittivity of the phases, duct geometry, electrical shielding, and temperature variation in the flow field. These issues are discussed, and the design of a 12.7 mm square d section capacitance sensor which measures liquid film thickness in either stratified or annular two-phase flow is presented. Using a composite material analysis and an effective permittivity ratio, predictive relations for capacitance as a function of liquid film thickness have been derived for stratified and annular film patterns. The anal eliminates the need for calibrating the sensor./or stratified and annular flow regimes Optical measurements of liquid film thickness using a high resolution CCD camera are compared against those using the capacitance sensor in conjunction with the predictive relations. The sensor was tested on a bench top for a stratified film pal with no flow and two different electrode configurations ( upward and side contigurations) using FC-87, a low-permittivity (er = 1.72) dielectric fluid. The standard deviations between the film thicknesses measured optically and those predicted using the capacitance sensor and analysis are 0.014 and 0.019 mm ,for the respective upward and side electrode configurations. The sensor was also implemented in a vertical flow boiling which uses FC-72(e&(r)=1.75)as the working fluid. Time-averaged film thicknesses measured using the capacitance sensor are co against ensemble-averaged measurements using the CCD camera for annular v upflow and downflow. The upflow and downflow standard deviations are O. I7 and 0.093 mm, respectively. As expected, the agreement for vertical flow is not as good as that for the horizontal no-flow case, because large fluctuations in film thickness are characteristic of annular two-phase flow, and the uncertainty of the photographic measurement is increased.
机译:近年来,使用电容传感器来测量两相流中的液膜厚度或相浓度的方法已经普及。在设计1个传感器时,为了优化性能,必须考虑许多问题:所需的时间和空间分辨率,两相流态,相的介电常数,管道几何形状,电屏蔽以及流场中的温度变化。讨论了这些问题,并提出了一种用于测量分层或环形两相流中液膜厚度的12.7 mm方形截面电容传感器的设计。使用复合材料分析和有效介电常数比率,已得出分层和环形薄膜图案的电容与液体薄膜厚度的关系的预测关系。肛门消除了校准传感器的需要,和/或分层和环形流动状态,将高分辨率CCD相机对液膜厚度的光学测量结果与使用电容传感器并结合预测关系的光学测量结果进行了比较。使用低介电常数(er = 1.72)电介质流体FC-87在台式台式传感器上测试了无流动的分层薄膜pal和两个不同的电极配置(向上和侧面重叠)。对于相应的向上和侧面电极配置,光学测量的薄膜厚度与使用电容传感器和分析预测的薄膜厚度之间的标准偏差为0.014和0.019 mm。该传感器还以垂直流沸腾形式实现,它使用FC-72(e&(r)= 1.75)作为工作流体。使用电容式传感器测量的时间平均膜厚与使用CCD摄像机进行环形v上流和下流的整体平均测量值相对应。上流和下流标准偏差分别为0.17 mm和0.093 mm。不出所料,垂直流的一致性不如水平无流情况,这是因为环形两相流的膜厚波动较大,并且照相测量的不确定性增加了。

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