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首页> 外文期刊>Journal of chemical theory and computation: JCTC >A Density Functional Theory Study of Ground and Low-Lying Excited Electronic States in Defective Graphenes
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A Density Functional Theory Study of Ground and Low-Lying Excited Electronic States in Defective Graphenes

机译:缺陷石墨烯中基态和低层激发电子态的密度泛函理论研究

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摘要

Electronic states of graphenes, whose carbon atoms are terminated by hydrogen atoms (hydrogenated graphene, denoted H-graphene) and defective graphene (one carbon atom was removed from H-graphene, denoted D-graphene) have been investigated by density functional theory. The sizes of graphenes examined in the present study were n = 7, 14, 19, 29, 37, 44, and 52; where n is the number of benzene rings in the graphene. The excitation energies of H-graphenes were gradually decreased as a function of the number of rings. In D-graphene, new energy levels for the first and second excited states appeared as low-lying excited states. It was found that the formation of defect sites in graphene produces large decreases in the excitation energies for third and higher excited states. The highest occupied molecular orbital and lowest unoccupied molecular orbital (LUMO) in H-graphene were widely delocalized over the graphene surface. On the other hand, LUMO in D-graphene was localized only in the defect sites. The effects of vacancy defects on both the ground and excited electronic states of graphene were discussed on the basis of theoretical results.
机译:通过密度泛函理论研究了碳原子被氢原子(氢化石墨烯,表示为H-石墨烯)和有缺陷的石墨烯(从H-石墨烯中去除一个碳原子,表示为D-石墨烯)终止的石墨烯的电子态。在本研究中检查的石墨烯的大小为n = 7、14、19、29、37、44和52;其中n是石墨烯中苯环的数目。 H-石墨烯的激发能随环数的增加而逐渐降低。在D-石墨烯中,第一和第二激发态的新能级表现为低洼激发态。发现在石墨烯中缺陷位点的形成使第三和更高激发态的激发能大大降低。 H-石墨烯中最高的占据分子轨道和最低的未占据分子轨道(LUMO)在石墨烯表面上广泛地离域。另一方面,D-石墨烯中的LUMO仅位于缺陷部位。根据理论结果,探讨了空位缺陷对石墨烯基态和激发电子态的影响。

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