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首页> 外文期刊>Journal of cardiovascular electrophysiology >To Test or Not to Test During Defibrillator Implantation? A Reassessment of the Conventional Wisdom
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To Test or Not to Test During Defibrillator Implantation? A Reassessment of the Conventional Wisdom

机译:在除颤器植入过程中进行测试还是不进行测试?对传统智慧的重新评估

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From the inception of implantable cardioverter defibrilla-tors (ICDs), defibrillation testing has been conducted at the time of implantation. Initially, defibrillation testing was performed through implanted epicardial patches and an external defibrillator to test the efficacy of this arrangement in terminating ventricular fibrillation (VF). Testing in this manner assured the appropriateness of implanting a generator only after verifying successful defibrillation with the chosen lead configuration. The concept emerged of an adequate "safety margin" for defibrillation as an implant criterion, traditionally accepted as a defibrillation threshold (DFT) at least 10 J below the maximum energy of the device.With the introduction of endocardial leads, defibrillation testing remained an important aspect of implantation, as=15% patients were found to have high DFTs with monophasic shocks and required revision for new high-voltage coils or epicardial patches
机译:从植入式心脏复律除颤器(ICD)诞生以来,就已经在植入时进行了除颤测试。最初,通过植入的心外膜片和外部除纤颤器进行除颤测试,以测试这种布置在终止心室纤颤(VF)方面的功效。以这种方式进行的测试确保只有在用选定的导线配置对除颤器进行了成功的除颤之后,才适合植入发生器。这个概念的出现是为除颤提供了足够的“安全裕度”作为植入标准,传统上被接受为除装置最大能量以下至少10 J的除颤阈值(DFT)。随着心内膜导联的引入,除颤测试仍然是重要的在植入方面,因为发现有15%的患者具有高的DFT,并伴有单相电击,需要对新的高压线圈或心外膜片进行修订

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