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首页> 外文期刊>Journal of child psychology and psychiatry >Bifactor latent structure of ADHD/ODD symptoms: predictions of dual-pathway/trait-impulsivity etiological models of ADHD.
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Bifactor latent structure of ADHD/ODD symptoms: predictions of dual-pathway/trait-impulsivity etiological models of ADHD.

机译:ADHD / ODD症状的双因素潜在结构:ADHD双重途径/特质冲动病因模型的预测。

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摘要

Consistent with predictions derived from recently articulated dual-pathway and trait-impulsivity models of externalizing liability, and from behavioral genetics studies indicating near complete overlap in vulnerability to ADHD and ODD, ADHD and ODD symptoms arose from a single, general disruptive behavior factor, which accounted for all of the variance in HI subscale scores and over half of the variance IN and ODD subscales. Thus, IN, HI, and ODD subscale scores strongly reflect a general disruptive behavior factor – not the specific content of their respective constructs.
机译:与最近阐明的外部化责任的双重途径和特质冲动模型以及行为遗传学研究得出的预测一致,该行为遗传学研究表明对ADHD和ODD的脆弱性几乎完全重叠,ADHD和ODD症状是由单一的一般破坏性行为因素引起的,占HI子量表分数的所有方差以及IN和ODD子量表的方差的一半以上。因此,IN,HI和ODD分量表得分强烈反映了一般的破坏行为因素,而不是其各自结构的具体内容。

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