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首页> 外文期刊>Journal of Applied Mechanics: Transactions of the ASME >Characterization of plastic deformation induced by microscale laser shock peening
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Characterization of plastic deformation induced by microscale laser shock peening

机译:微型激光冲击喷丸引起的塑性变形的表征

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Electron backscatter diffraction (EBSD) is used to investigate crystal lattice rotation caused by plastic deformation during high-strain rate laser shock peening in single crystal aluminum and copper sample on (1 (1) over bar0) and (001) surfaces. New experimental methodologies are employed which enable measurement of the in-plane lattice rotation under approximate plane-strain conditions. Crystal lattice rotation on and below the microscale laser shock peened sample surface was measured and compared with the simulation result obtained from FEM analysis, which account for single crystal plasticity. The lattice rotation measurements directly complement measurements of residual strain/stress with X-ray micro-diffraction using synchrotron light source and it also gives an indication of the extent of the plastic deformation induced by the microscale laser shock peening.
机译:电子背散射衍射(EBSD)用于研究在(1(1)在bar0)和(001)表面上的高应变速率激光冲击喷丸过程中由塑性变形引起的晶格旋转。采用了新的实验方法,能够在近似平面应变条件下测量面内晶格旋转。测量了在微尺度激光冲击强化的样品表面上和下方的晶格旋转,并将其与通过FEM分析获得的模拟结果进行了比较,这是单晶可塑性的原因。晶格旋转测量直接补充了使用同步加速器光源进行的X射线微衍射对残余应变/应力的测量,并且还指示了微尺度激光冲击喷丸引起的塑性变形的程度。

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