首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Hydrogen plasma treatment on catalytic layer and effect of oxygen additions on plasma enhanced chemical vapor deposition of carbon nanotube
【24h】

Hydrogen plasma treatment on catalytic layer and effect of oxygen additions on plasma enhanced chemical vapor deposition of carbon nanotube

机译:催化层上的氢等离子体处理以及氧的添加对碳纳米管等离子体增强化学气相沉积的影响

获取原文
获取原文并翻译 | 示例
           

摘要

Multi-wall carbon nanotubes have been synthesized by plasma enhanced chemical vapor deposition (CVD) on Co-coated silicon substrates. Prior to the deposition of carbon nanotubes, dense and uniform nanosized catalytic seeds were formed by hydrogen plasma treatment on Co thin film. The size and morphology of Co catalytic seeds varied with hydrogen plasma treatment time. In the carbon nanotube growing process, a mixture of Ch_4 and H_2 was used as gas source. Small O_2 additions to the CH_4-H_2 gas mixture (0-12 percent of mixture gas) improved the purity of carbon nanotubes and surprisingly led to high quality even at low growth temperature (610 deg C) as observed in high-resolution transmission electron microscopy (HRTEM). In order to understand the growth process by CH_4-H_2-O_2 plasma CVD in detail, optical emission spectroscopy (OES) was introduced. The results of OES analysis showed that, with the increase of oxygen amount, the intensity of C_2 decreased gradually, but the intensity of the OH radical increased sharply. It probably leads to increasing the etching effect on defective structure by affluent OH radical and suppressing super-saturation of carbon molecules at growing edges.
机译:多壁碳纳米管已经通过等离子体增强化学气相沉积(CVD)在Co涂层硅基板上合成。在沉积碳纳米管之前,通过氢等离子体处理在Co薄膜上形成致密且均匀的纳米级催化晶种。 Co催化种子的大小和形态随氢等离子体处理时间而变化。在碳纳米管生长过程中,使用Ch_4和H_2的混合物作为气源。在高分辨率透射电子显微镜中观察到,向CH_4-H_2气体混合物中少量添加O_2(占混合气体的0-12%)提高了碳纳米管的纯度,并且即使在低生长温度(610摄氏度)下也令人惊讶地实现了高质量。 (HRTEM)。为了详细了解CH_4-H_2-O_2等离子体CVD的生长过程,引入了光发射光谱(OES)。 OES分析的结果表明,随着氧含量的增加,C_2的强度逐渐降低,但OH自由基的强度急剧增加。这可能会导致通过富集OH自由基增加对缺陷结构的蚀刻效果,并抑制生长边缘处碳分子的过饱和。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号