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Big tight closure test elements for some non-reduced excellent rings

机译:大的密闭性测试元件,用于某些未还原的优质环

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This paper is concerned with existence of big tight closure test elements for a commutative Noetherian ring R of prime characteristic p. Let R~? denote the complement in R of the union of the minimal prime ideals of R. A big test element for R is an element of R? which can be used in every tight closure membership test for every R-module, and not just the finitely generated ones. The main results of the paper are that, if R is excellent and satisfies condition (R_0), and c∈R? is such that R_c is Gorenstein and weakly F-regular, then some power of c is a big test element for R if (i) R is a homomorphic image of an excellent regular ring of characteristic p for which the Frobenius homomorphism is intersection-flat, or (ii) R is F-pure, or (iii) R is local. The Gamma construction is not used.
机译:本文关注主要特征为p的可交换Noether环R的大紧闭测试元素的存在。让R〜?表示R的最小素理想的并集在R中的补。R的一个大测试元素是R?它可以用于每个R模块的每个紧密闭合成员资格测试,而不仅限于有限生成的模块。本文的主要结果是,如果R极好且满足条件(R_0),则c∈R?使得R_c是Gorenstein且弱F-正则的,则如果(i)R是特征p为极好的正则环的同构图像且Frobenius同态是交平面的,则c的某些幂是R的重要测试元素,或(ii)R为纯F,或(iii)R为局部。不使用Gamma构造。

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