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首页> 外文期刊>Journal of Applied Crystallography >A program for refinement of lattice parameters based on multiple convergent-beam electron diffraction patterns
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A program for refinement of lattice parameters based on multiple convergent-beam electron diffraction patterns

机译:基于多个会聚束电子衍射图的晶格参数优化程序

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摘要

A package of computer programs for refinement of lattice parameters based on convergent-beam electron diffraction ( CBED) patterns has been developed. The package is intended to facilitate the measurement of local elastic strains. The strain or lattice parameters are determined by matching experimental and simulated central disks of CBED patterns. The kinematical simulation is used in the primary fitting. In some cases, further refinement by means of dynamical simulation can be applied. User-specified strain components, camera lengths and voltage can be fitted. The software is not limited to any particular material or structure. It is capable of simultaneous matching of multiple patterns originating from the same sample location. The use of a number of different strategies allows for the verification of results and for checking their reliability. Operation of the software is controlled via a Windows user interface.
机译:已经开发了用于基于会聚束电子衍射(CBED)模式优化晶格参数的计算机程序包。该包装旨在促进局部弹性应变的测量。应变或晶格参数是通过匹配CBED模式的实验和模拟中心盘确定的。运动学模拟用于主要拟合中。在某些情况下,可以应用通过动态仿真进行的进一步优化。可以安装用户指定的应变分量,摄像机长度和电压。该软件不限于任何特定的材料或结构。它能够同时匹配源自同一样本位置的多个模式。使用多种不同的策略可以验证结果并检查其可靠性。该软件的操作通过Windows用户界面控制。

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