The family of techniques known as scanning probe microscopy (SPM) was invented in 1981 by Binnig and Rohrer. The most common methods are scanning-tunneling microscopy, atomic-force microscopy (AFM), and near-field scanning optical microscopy, although hundreds of other variants have since been developed. Regardless of the specific version, each applies the same basic concept: detecting interactions between a scannable nanoscale probe and a nearby surface in order to measure and/or map local surface properties. Atomic-force microscopy was designed for detecting and mapping tip-sample forces. These include repulsive and attractive interactions such as van der Waals, electronic, and magnetic forces, though applications to detect chemical, thermal, acoustic, and a host of other properties have since been implemented. The concept also extends to lithography, whereby the probe is used to modify a surface through physical, electronic, chemical, or thermal means.
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