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Influence of oxygen and nitrogen addition during growth of CVD diamond on pure cobalt substrates

机译:CVD金刚石生长过程中氧和氮的添加对纯钴衬底的影响

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It was shown that in MPCVD reactors the use of common H and CH_4 flows, can lead to the formation of free-standing diamond films directly on pure cobalt substrates. The characteristic low adhesion of these films can be explained by the formation of a graphitic layer between the substrate and the film. Scanning electron microscopy analysis shows special areas at the film grain boundaries that were subsequently identified as cobalt inclusions by EDS. In this work we have studied the influence of oxygen and nitrogen addition on the film's growth morphology. Once again SEM and EDS were used to access respectively the films growth morphology and cobalt content. Our results clearly indicate that the addition of oxygen during the initial stages of diamond nucleation prevents diffusion of cobalt into the film. Further, we believed that this effect is likely due to the formation of a cobalt-oxide layer between the film and the substrate. Also, the addition of nitrogen and oxygen the later during nucleation or during growth leads to an increase in the film's growth rate. A preferential (111) surface morphology with clear octahedron facets and films with dominant (100) crystallographic planes are detected. A model is presented for the growth of CVD diamond on cobalt substrates with the addition of oxygen and nitrogen.
机译:结果表明,在MPCVD反应器中,使用常见的H和CH_4流可导致直接在纯钴基底上形成独立的金刚石膜。这些膜的特征性低粘附性可以通过在基底和膜之间形成石墨层来解释。扫描电子显微镜分析显示出膜晶界的特殊区域,随后被EDS鉴定为钴夹杂物。在这项工作中,我们研究了添加氧气和氮气对薄膜生长形态的影响。再次使用SEM和EDS分别访问膜的生长形态和钴含量。我们的结果清楚地表明,在金刚石成核的初始阶段添加氧气可防止钴扩散到薄膜中。此外,我们认为这种效果很可能是由于在薄膜和基材之间形成了氧化钴层。同样,在成核过程中或在生长过程中后期添加氮和氧会导致薄膜的生长速率增加。检测到具有清晰八面体刻面的优先(111)表面形态和具有优势(100)晶面的薄膜。提出了一种模型,用于在氧和氮的添加下在钴基底上生长CVD金刚石。

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