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Comparative study of metal/amorphous-carbon multilayer structures produced by magnetron sputtering

机译:磁控溅射制备金属/非晶碳多层结构的比较研究

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摘要

The present study discusses the structural and mechanical properties of metal/amorphous carbon (a-C) multilayer structures of a-C/Mo/a-C/…/Mo/substrate and a-C/W/a-C/…/W/substrate deposited by magnetron sputtering. To this end, the effects of deposition parameters on multilayered nanometric structures were examined. Samples consisted of structures with alternate metallic and a-C layers with thicknesses in the nanometric range (1-3 nm). The films were deposited on crystalline silicon and glass substrates at room temperature using two opposing magnetron sputtering heads, which allowed the alternate deposition of the metallic and a-C films on the substrates placed on a directional holder. The substrate negative bias voltage was varied between 40 and 300 V and the process was performed at Ar pressures in the range 0.2-2 Pa. The structural and morphological properties and local order of the layers and interfaces were analysed by transmission electron microscopy and X-ray diffraction. Mechanical stress, and critical load for coating failure were measured by profilometry and the microscratch technique, respectively, and the results are discussed in terms of the deposition conditions and the multilayer nanostructure. Potential applications of films based on metal/a-C multilayers include the production of hard, protective, wear-resistant coatings for corrosion-resistant and high temperature-resistant applications.
机译:本研究讨论了磁控溅射沉积的a-C / Mo / a-C /…/ Mo /衬底和a-C / W / a-C /…/ W /衬底的金属/非晶碳(a-C)多层结构的结构和力学性能。为此,检查了沉积参数对多层纳米结构的影响。样品由具有交替的金属层和a-C层的结构组成,其厚度在纳米范围内(1-3 nm)。使用两个相对的磁控溅射头在室温下将薄膜沉积在晶体硅和玻璃基板上,这可以将金属和a-C薄膜交替沉积在定向支架上的基板上。衬底的负偏置电压在40至300 V之间变化,并且该过程在Ar压力为0.2-2 Pa的范围内进行。通过透射电子显微镜和X-射线分析了层和界面的结构和形态特性以及局部顺序射线衍射。通过轮廓测定法和微划痕技术分别测量了机械应力和涂层破坏的临界载荷,并根据沉积条件和多层纳米结构讨论了结果。基于金属/ a-C多层薄膜的潜在应用包括生产硬质,保护性,耐磨涂层,用于耐腐蚀和耐高温应用。

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