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Diameter dependence of interwall separation and strain in multiwalled carbon nanotubes probed by X-ray diffraction and Raman scattering studies

机译:X射线衍射和拉曼散射研究探测的多壁碳纳米管中壁间距和应变的直径依赖性

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We have made a systematic study on the diameter dependent spectral features in X-ray diffraction (XRD) and Raman scattering studies of multiwalled carbon nanotubes (MWCNTs) of various diameters in the range 5-100 nm. High resolution transmission electron microscopy (HRTEM) imaging reveals a systematic decrease in the interwall separation from 3.8 A down to 3.2 A as the diameter of nanotubes increases from 5.8 nm to 63.2 nm. Analysis of the XRD patterns shows an exponential decrease in d002 interlayer spacing with increasing tube diameter, in close agreement with the HRTEM results. Further, XRD profile line width shows inverse diameter dependence and exponential increase in intensity as the diameter of the MWCNTs increases. Raman spectra of different diameter nanotubes show different evolutions of metallic and semiconducting components in the G-band, as found from spectral deconvolution. The frequency and full width at half maximum (FWHM) of the semiconducting component of the G~- band gradually decreases as the tube diameter increases. Ratio of intensities of G~- band to D-band first shows a sharp fall as the tube diameter increases from 7 nm to 15 nm and then slowly increases with increasing diameter. On the other hand, Gmode frequency shows large up shift when average diameter is increased from 7 nm to 15 nm and then saturates for higher diameter tubes. Analysis of Raman and XRD data reveals that the lowest diameter (7 nm) MWCNTs have features similar to those of the single walled nanotubes, while the spectral features are distinctly different for higher diameter MWCNTs due to the interaction among tube walls that is very significant for large diameter MWCNTs. Observed diameter dependence of the spectral features is explained in terms of nanotube curvature and atomic vibrations involving interaction among the walls in MWCNTs. The present study demonstrates the power of XRD for nondestructive evaluation of diameter distribution and interwall separation in MWCNTs with wide range of diameters.
机译:我们对X射线衍射(XRD)和拉曼散射研究中的直径相关光谱特征进行了系统研究,研究了5-100 nm范围内各种直径的多壁碳纳米管(MWCNT)。高分辨率透射电子显微镜(HRTEM)成像显示,随着纳米管直径从5.8 nm增加到63.2 nm,壁间距从3.8 A下降到3.2 A的系统减小。对XRD图谱的分析表明,随着管直径的增加,d002层间间距呈指数下降,这与HRTEM结果非常吻合。此外,随着MWCNT的直径增加,XRD轮廓线的宽度显示出直径的倒数依赖性和强度的指数增加。从光谱反卷积可以发现,不同直径的纳米管的拉曼光谱显示出G波段中金属和半导体成分的不同演变。随着管径的增加,G〜-带半导体成分的频率和半峰全宽(FWHM)逐渐降低。随着管直径从7 nm增加到15 nm,G〜波段与D波段的强度比首先显示出急剧下降,然后随着直径的增加而缓慢增加。另一方面,当平均直径从7 nm增加到15 nm时,Gmode频率显示出较大的上移,然后对于较大直径的管饱和。拉曼和XRD数据分析表明,最小直径(7 nm)的MWCNT具有与单壁纳米管相似的特征,而较大直径的MWCNT的光谱特征明显不同,这是由于管壁之间的相互作用对大直径的碳纳米管。观察到的光谱特征的直径依赖性是根据纳米管曲率和涉及MWCNTs壁间相互作用的原子振动来解释的。本研究证明了XRD对直径范围宽的MWCNT的直径分布和壁间分离进行无损评估的能力。

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