首页> 外文期刊>Health Physics: Official Journal of the Health Physics Society >New electron backscatter correction factors for accurate skin depth dose calculation from skin contamination by hot particles.
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New electron backscatter correction factors for accurate skin depth dose calculation from skin contamination by hot particles.

机译:新的电子反向散射校正因子,可根据热粒子对皮肤的污染进行精确的皮肤深度剂量计算。

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摘要

New backscatter correction factors have been calculated using the GEPTS Monte Carlo code system for the case of an isotropic electron point source located at the boundary of a semi-infinite water medium. The backscatter correction factor is defined as the ratio of the dose in a semi-infinite medium to the dose, at the same point, in an infinite medium. It is found that the backscatter correction factor variation with position inside the medium is significant. However, the backscatter correction factor variation with energy is quite small for electron energies less than 1 MeV. The backscatter correction factor data are tabulated for energies of 1, 2, 3, and 4 MeV as functions of radial distance and angular direction. The proposed backscatter correction factors can be used for skin depth-dose calculations from beta particles emitted by either point sources or planar sources. Arbitrary target volumes and beta particle spectra can be considered. The new backscatter correction factors provide an alternative to the current data for accurate skin depth-dose calculations from skin contamination by hot particles.
机译:对于各向同性电子点源位于半无限水介质边界的情况,已经使用GEPTS蒙特卡罗代码系统计算了新的反向散射校正因子。反向散射校正因子定义为半无限介质中的剂量与无限点介质中相同点处的剂量之比。发现反向散射校正因子随介质内部位置的变化是很大的。但是,对于小于1 MeV的电子能量,背向散射校正因子随能量的变化非常小。将1、2、3和4 MeV的能量的背向散射校正因子数据制成表格,这些函数是径向距离和角度方向的函数。拟议的反向散射校正因子可用于根据点源或平面源发射的β粒子进行皮肤深度剂量计算。可以考虑任意目标体积和β粒子光谱。新的反向散射校正因子为当前数据提供了一种替代方案,可根据热粒子对皮肤的污染进行准确的皮肤深度剂量计算。

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