首页> 外文期刊>Chinese physics letters >Shadow Effect and Its Revisal in Grid-Enhanced Plasma Source with Ion Implantation Method
【24h】

Shadow Effect and Its Revisal in Grid-Enhanced Plasma Source with Ion Implantation Method

机译:离子注入法增强栅极等离子体源的阴影效应及其修正

获取原文
获取原文并翻译 | 示例
           

摘要

The implanting voltage, gas pressure and the grid electrode radius are the key parameters influencing the surface grid shadow effect that has been observed in our grid-enhanced plasma source ion implantation experiment. To reduce the shadow effect and obtain a corresponding better implantation uniformity of sample surfaces, we need to use lower implanting voltage, higher gas pressure and smaller grid radius. Furthermore, we apply an axial magnetic field to increase the plasma density inside the tube and to mix the plasma outside the grid, so that the shadow effect of sample surfaces can be weakened.
机译:注入电压,气体压力和栅电极半径是影响表面栅阴影效应的关键参数,在我们的栅增强等离子体源离子注入实验中已经观察到了这些参数。为了减少阴影效应并获得相应的更好的样品表面注入均匀性,我们需要使用较低的注入电压,较高的气压和较小的栅极半径。此外,我们施加轴向磁场以增加管内的等离子体密度并在网格外部混合等离子体,从而可以减弱样品表面的阴影效应。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号