Escape of photons and electrons from an HPGe detector at 81 keV

摘要

Escape of Ge K x-rays, Compton-scattered incident radiation and photoelectrons from an HPGe detector was investigated for 81 keV incident photons. All three escape mechanisms were observed in the same experiment. Experimental escape fractions were compared with the results from Monte Carlo simulations. Good agreement was obtained for the escape of photons. However, the simulations underestimated the escape of photoelectrons. Copyright (c) 2005 John Wiley & Sons, Ltd.