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H~+ and He~(2+) induced W L X-rays intensity ratios: Part I, Si(Li) data and EDS high resolution insight

机译:H〜+和He〜(2+)诱导的W L X射线强度比:第一部分,Si(Li)数据和EDS高分辨率见解

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Recently, the authors have presented experimental evidences that for some energy windows, proton-induced W L shell X-rays intensity ratios of transitions to L_1 subshell depend on the ion beam energy and on the chemical species even after known matrix effects are subtracted. These results, which put in question the assumption of the invariance of the relative intensity of X-ray transitions to the same atomic subshells, are further exploited in this work, where more data for three different W compounds (W, Li_2WO_4 and P_2O_5.24WO_3.xH_2O) are presented followed by a detailed study using an ultra-pure (99.995%) W thick foil, used to avoid any possible target contamination interference on the results. Samples were irradiated by H+ beams in various conditions in the energy range between 0.25 and 2.38MeV and by He~(2+) beams having energies between 3.5 and 5.0MeV. Spectra were collected using the Si(Li) detector at CTN 2.5MV Van de Graaff standard Proton-Induced X-ray Emission (PIXE) set-up as well as using the Energy Dispersive Spectrometry (EDS) high resolution X-ray microcalorimeter spectrometer (XMS) at CTN 3.0MV Tandetron accelerator high resolution high energy (HRHE) PIXE end station. Results were normalized to the theoretical intensity ratios and plotted as function of the ratio of collision characteristic times allowing the comparison of H+ and He2+ results. W L X-rays intensity ratio variations are presented and compared with theoretical expected results. Radiative Auger emission transitions observed in an EDS high resolution XMS spectra are shown to probably play a crucial role in the highly unexpected results obtained for intensity ratios of transitions to the same subshell.
机译:最近,作者提供了实验证据,即对于某些能量窗,质子诱导的向L_1子壳转变的W L壳X射线强度比取决于离子束能量和化学种类,即使在减去已知的基质效应后也是如此。这些结果质疑了X射线跃迁至相同原子子壳的相对强度不变的假设,在这项工作中进一步利用了其中三种不同W化合物(W,Li_2WO_4和P_2O_5.24WO_3的更多数据)的结果。提出(.xH_2O),然后使用超纯(99.995%)W厚箔进行详细研究,以避免任何可能的目标污染干扰结果。在能量条件为0.25和2.38MeV之间的各种条件下,用H +束辐照样品,并在能量为3.5和5.0MeV之间的He〜(2+)束辐照样品。使用CTN 2.5MV Van de Graaff标准质子诱导X射线发射(PIXE)装置上的Si(Li)检测器以及能量分散光谱(EDS)高分辨率X射线微量量热计( XMS)位于CTN 3.0MV Tandetron加速器高分辨率高能(HRHE)PIXE终端站。将结果归一化为理论强度比,并绘制为碰撞特征时间比的函数,以便比较H +和He2 +结果。提出了W X射线强度比变化,并将其与理论预期结果进行了比较。在EDS高分辨率XMS光谱中观察到的辐射俄歇发射跃迁显示出在跃迁至同一子壳的强度比所获得的高度意外结果中可能起关键作用。

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