Recent advances in automated evaluation and on-line prediction of Al-Si eutectic modification level

摘要

This paper outlines the development of methodologies for the quantitative assessment of the Al-Si eutectic modification level using an advanced image analysis system (IAS) and for the online prediction of the Al-Si eutectic modification level using a thermal analysis system (TAS). The first part of the work involves the development of digital criteria for each modification level based on the AFS chart concept and the establishment of relationships between the modification levels and Sr content. To create the final stereological criterion, the morphologies of the Si structures at the different AFS modification levels were measured using the IAS according to six candidate criteria (area, length, width, perimeter, aspect ratio and equivalent diameter). The validity of each candidate criterion is discussed. The later part of the work involves the establishment of relationships between TAS parameters, the final IAS criterion and Sr content. This relationship enables a TAS to make on-line quantitative predictions of the Al-Si modification level.