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首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts (Conference Paper)
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Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts (Conference Paper)

机译:同时从单个大簇撞击中检测和定位次级离子和电子(会议论文)

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摘要

The use of large cluster primary ions (e.g. C_(60), Au _(400)) in secondary ion mass spectrometry has become prevalent in recent years due to their enhanced emission of secondary ions, in particular, molecular ions (MW ≤ 1500 Da). The co-emission of electrons with SIs was investigated per projectile impact. It has been found that SI and electrons yields increased with increasing projectile energy and size. The use of the emitted electrons from impacts of C_(60) for localization has been demonstrated for cholesterol deposited on a copper grid. The instrumentation, methodologies, and results from these experiments are presented.
机译:近年来,由于次级离子尤其是分子离子(MW≤1500 Da)的发射增强,因此在次级离子质谱分析中使用大簇初级离子(例如C_(60),Au _(400))已变得很普遍。 )。电子与SIs的共同发射是针对每个弹丸撞击进行研究的。已经发现,SI和电子的产率随着射弹能量和尺寸的增加而增加。对于沉积在铜栅上的胆固醇,已经证明了利用C_(60)的撞击发射的电子进行定位。介绍了这些实验的仪器,方法和结果。

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