首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >Electro-oxidation and reduction of H-2 on platinum studied by scanning electrochemical microscopy for the purpose of local detection of H-2 evolution
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Electro-oxidation and reduction of H-2 on platinum studied by scanning electrochemical microscopy for the purpose of local detection of H-2 evolution

机译:扫描电化学显微镜研究铂上的H-2的电氧化和还原,以局部检测H-2的生成

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摘要

Electrochemical detection of H-2 using scanning electrochemical microscopy (SECM) has shown to hold great promise as a sensitive characterization method with high spatial resolution for active surfaces generating H-2. Herein, the factors contributing to the current that is measured by SECM in generation/collection mode for H-2 detection are studied. In particular, the concentration gradient of H-2 at the substrate, the H-2/H+ recycling between the SECM tip and substrate and hemispherical profile of H-2 diffusion has been discussed. It was postulated that H-2/H+ recycling plays a dominant role in the oxidative current measured in generation/collection mode of SECM when the microelectrode is positioned in close vicinity of substrate. Copyright (C) 2015 John Wiley & Sons, Ltd.
机译:使用扫描电化学显微镜(SECM)对H-2进行电化学检测已显示出巨大的希望,因为它是一种灵敏的表征方法,对产生H-2的活性表面具有高空间分辨率。在本文中,研究了由SECM在生成/收集模式下用于H-2检测的电流的影响因素。特别是,讨论了底物上H-2的浓度梯度,SECM尖端和底物之间的H-2 / H +循环以及H-2扩散的半球形轮廓。据推测,当微电极位于基板附近时,H-2 / H +循环在SECM的生成/收集模式下测量的氧化电流中起主要作用。版权所有(C)2015 John Wiley&Sons,Ltd.

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