首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >Monte Carlo simulation of spatial distribution of X rays in multifilm targets. III: optimum design as applied to W/Al-film targets
【24h】

Monte Carlo simulation of spatial distribution of X rays in multifilm targets. III: optimum design as applied to W/Al-film targets

机译:多层靶中X射线空间分布的蒙特卡罗模拟。 III:应用于W / Al膜靶的最佳设计

获取原文
获取原文并翻译 | 示例
           

摘要

The brightness of the X-ray source in a W/Al-film target used for X-ray projection microscopy was studied by an approach using the Monte Carlo simulation. Since continuous X rays generated in a thin film have a specific angular distribution of emission, the brightness of the continuous X-ray source cannot simply be estimated on the assumption that the angular distribution is homogeneous. The newly developed approach using the Monte Carlo simulation enables the evaluation of the effective source size, angular distribution, and brightness of a continuous X-ray source with sufficient accuracy that it leads to the optimum design of a high-brightness X-ray source for uses such as X-ray projection microscopy. The Monte Carlo calculations were performed for W(Delta z)/Al (200 mu m)-film targets with different thicknesses of W film, Delta z, under bombardment of 60 kV electrons. The results have suggested an optimum design consisting of a W (2 mu m)/Al (200 mu m)-film target as most promising for providing an X-ray source of higher brightness than the W (5 mu m)/Al (200 mu m)-film target, which has already been in practice for X-ray projection microscopy. Copyright (c) 2006 John Wiley & Sons, Ltd.
机译:通过使用蒙特卡洛模拟的方法研究了用于X射线投影显微镜的W / Al膜靶材中X射线源的亮度。由于在薄膜中产生的连续X射线具有特定的发射角分布,因此不能简单地基于角度分布是均匀的假设来估计连续X射线源的亮度。使用蒙特卡洛模拟技术的新开发方法能够以足够的精度评估连续X射线源的有效源尺寸,角度分布和亮度,从而可以为高亮度X射线源进行最佳设计。用途,例如X射线投影显微镜。在60 kV电子轰击下,对具有不同厚度的W膜Delta Z的W(Delta z)/ Al(200μm)膜靶材进行了Monte Carlo计算。结果表明,由W(2μm)/ Al(200μm)膜靶组成的最佳设计是最有希望提供比W(5μm)/ Al( 200微米)胶片靶,实际上已经用于X射线投影显微镜。版权所有(c)2006 John Wiley&Sons,Ltd.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号