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In situ XRD measurements during plasma nitriding of a medium carbon steel

机译:中碳钢等离子渗氮过程中的原位XRD测量

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This paper describes a system designed for in situ X-ray diffraction (XRD) analysis during plasma nitriding and gives results of some initial experiments. Besides in situ XRD, the AISI 1045 nitrided samples were analysed by glow discharge optical spectroscopy (GDOS), metallography and hardness tests. The results presented in this paper show that XRD in situ analysis during plasma nitriding can be successfully established. These first tests suggested-that, in the long term, a number,of important issues of plasma nitriding can be clarified using both in situ XRD measurements together with commonly used post-mortem techniques. Good intensity and resolution were obtained with this equipment, although data collection was time-consuming. The effects of three different gas composition have been confirmed during the nitriding time and temperature applied. The 76 % N-2-24 % H-2 gas composition produces thick compound layers and diffusion zones whereas the 5 % N-2-95 % H-2 gas composition results in a thin compound layer and thick diffusion zone. The 100 % N-2 gas composition was found to give almost no nitriding effect. (c) 2004 Elsevier B.V. All rights reserved.
机译:本文介绍了一种专为等离子体氮化过程中的原位X射线衍射(XRD)分析而设计的系统,并提供了一些初步实验的结果。除原位XRD外,还通过辉光放电光谱(GDOS),金相学和硬度测试对AISI 1045氮化样品进行了分析。本文提出的结果表明,可以成功地建立等离子体渗氮过程中的XRD原位分析。这些最初的测试表明,从长远来看,使用原位XRD测量和常用的验尸技术可以澄清许多重要的等离子体氮化问题。尽管数据收集很耗时,但使用此设备仍可获得良好的强度和分辨率。在施加氮化时间和温度期间,已确认三种不同气体成分的影响。 76%的N-2-24%H-2气体成分产生较厚的化合物层和扩散区,而5%的N-2-95%的H-2气体成分导致较薄的化合物层和较厚的扩散区。发现100%的N-2气体成分几乎没有氮化作用。 (c)2004 Elsevier B.V.保留所有权利。

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