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Chemical structure and morphology of thin bilayer and composite organosilicon and fluorocarbon microwave plasma polymer films

机译:双层和复合有机硅与碳氟化合物微波等离子体聚合物薄膜的化学结构和形态

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A microwave plasma polymerisation set-up with a linear plasma source was used to deposit thin bilayer and nanocomposite films of fluorocarbon and organosilicon plasma polymers. Hexamethyldisilane (HMDS) and heptadecafluoro-1-decen (HDFD) were used as monomers. The chemical structure was measured by means of Fourier Transformation Infrared Reflection Absorption Spectroscopy (IRRAS), X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Atomic Force Microscopy (AFM) and Field Emission Scanning Electron Microscopy measurements provided information about the surface morphology. The surface chemistry and surface morphology were correlated with the surface energy as calculated by contact angle measurements.The plasma polymer deposited from a gas mixture of heptadecafluoro-1-decen fluorocarbon and hexamethyldisilane consists of rough cauliflower, polysiloxane-like structures embedded in a smooth fluorocarbon matrix. Moreover, co-polymeric species which are likely to exist at the interface between the two phases in the film were observed. The bilayer system that consisted of a rough interfacial organosilane film coated with a smooth fluorocarbon layer, showed the lowest apparent surface energy and a high water contact angle as the result of both high surface roughness and a high concentration of surface CF2 groups. (C) 2004 Elsevier B.V. All rights reserved.
机译:具有线性等离子体源的微波等离子体聚合装置用于沉积碳氟化合物和有机硅等离子体聚合物的双层和纳米复合薄膜。六甲基乙硅烷(HMDS)和七氟-1-癸烯(HDFD)被用作单体。化学结构通过傅里叶变换红外反射吸收光谱法(IRRAS),X射线光电子能谱法(XPS)和飞行时间二次离子质谱法(ToF-SIMS)进行测量。原子力显微镜(AFM)和场发射扫描电子显微镜测量可提供有关表面形态的信息。表面化学和表面形态与通过接触角测量计算出的表面能相关。从七氟-1-癸碳氟化合物和六甲基乙硅烷的气体混合物中沉积的等离子体聚合物由粗糙的花椰菜,嵌入在光滑碳氟化合物中的聚硅氧烷样结构组成矩阵。此外,观察到可能存在于膜中两相之间的界面处的共聚物质。由高表面粗糙度和高浓度的表面CF2基团共同作用的双层体系,由涂有光滑碳氟化合物层的粗糙界面有机硅烷膜组成,显示出最低的表观表面能和高水接触角。 (C)2004 Elsevier B.V.保留所有权利。

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