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Detection of internal defect in pickling cucumbers using hyperspectral transmittance imaging.

机译:使用高光谱透射成像检测腌制黄瓜中的内部缺陷。

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摘要

Internal quality is an important aspect in the quality control and assurance of pickled products. A rapid and nondestructive method for internal defect detection would be of value to the pickle industry. A hyperspectral transmittance imaging technique was developed to detect internal defect in the form of carpel suture separation or hollow cucumbers resulting from dropping and rolling under load. Hyperspectral transmittance line scan images were collected from cv. Journey and Vlaspik cucumbers over a 6-day period after they were subjected to mechanical stress. Partial least squares discriminant analysis (PLS-DA) was performed on mean and s.d. spectra extracted from hyperspectral transmittance images to classify cucumber samples into defective or normal classes. A spectral-based pixel classification method using Euclidean distance was applied to classify pixels along the spatial dimension of the image into normal or defective class. Transmittance spectra of defective cucumbers were similar in shape to, but higher in magnitude than, those of normal cucumbers. Transmittance values for both defective and normal cucumbers were higher in the near-IR range of 700-1000 nm than those in the visible range (450-700 nm). Average classification accuracies of 90.2, 98.7 and 95.4% were achieved using PLS-DA, whereas accuracies of 89.1, 94.6 and 90.5% were achieved using the spectral-based pixel classification method for cv. Journey, Vlaspik and pooled data, respectively. Results suggest that hyperspectral transmittance imaging can be used for rapid detection of internal defects in pickling cucumbers.
机译:内部质量是腌制产品质量控制和保证中的重要方面。一种快速,无损的内部缺陷检测方法对腌制业具有重要意义。开发了一种高光谱透射成像技术,以检测心皮缝线分离或负载下掉落和滚动导致的空心黄瓜形式的内部缺陷。高光谱透射线扫描图像是从简历中收集的。在受到机械压力的情况下,经过6天的旅程和Vlaspik黄瓜。对均值和标准差进行偏最小二乘判别分析(PLS-DA)。从高光谱透射率图像中提取的光谱可将黄瓜样品分类为有缺陷或正常类别。应用了基于欧氏距离的基于光谱的像素分类方法,将沿图像空间维度的像素分类为正常或缺陷类别。有缺陷的黄瓜的透射光谱与普通黄瓜的形状相似,但强度更高。有缺陷和正常黄瓜的透射率值在700-1000 nm的近红外范围内均高于可见范围(450-700 nm)。使用PLS-DA的平均分类准确度达到90.2%,98.7%和95.4%,而使用基于光谱的cv像素分类方法获得的平均分类准确度则达到89.1、94.6和90.5%。旅程,Vlaspik和汇总数据。结果表明,高光谱透射成像可用于快速检测腌制黄瓜中的内部缺陷。

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