Molecular mapping of resistance gene to English grain aphid (Sitobion avenae F.) in Triticum durum wheat line C273.

摘要

The English grain aphid, Sitobion avenae (Fabricius), is one of the most important insect pests causing substantial yield losses in wheat production in China and other grain-growing areas in the world. The efficient utilization of wheat genes for resistance to English grain aphid (EGA) provides an efficient, economic and environmentally sound approach to reduce the yield losses. In the present study, the wheat line C273 (Triticum durum AABB, 2n=4x=28), is resistant to EGA in greenhouse and field tests. To identify the resistance gene, designated RA-1 temporarily, C273 was crossed with susceptible genotype Poland 305 (T. polonicum, AABB, 2n=4x=28). The F₁, F₂ and F_2:3 lines were tested with EGA in the field and greenhouse. The results indicated that RA-1 is a single dominant gene, closely linked to the microsatellite markers (SSR) Xwmc179, Xwmc553 and Xwmc201 on chromosome 6AL at genetic distances of 3.47, 4.73 and 7.57 cM, respectively. The three SSR markers will be valuable in marker-assisted selection for resistance to EGA as well as for cloning this gene in the future.Digital Object Identifier http://dx.doi.org/10.1007/s00122-011-1704-7