首页> 外文期刊>The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical >Thermal and Chemical Stability and Adhesion Stremgth of Pt Nanoparticle Arrays Supported on Silica Studied by Transmission Electron Microscopy and Atomic Force Microscopy
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Thermal and Chemical Stability and Adhesion Stremgth of Pt Nanoparticle Arrays Supported on Silica Studied by Transmission Electron Microscopy and Atomic Force Microscopy

机译:透射电子显微镜和原子力显微镜研究硅胶上负载的Pt纳米颗粒阵列的热化学稳定性和粘附强度

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The thermal, chemical, and mechanical stability of Pt nanoparticles supported on silica has been measured with transmission electron microscopy (TEM) and atomic force microscopy (AFM). The nanoparticle arrays were fabricalted using electron beam lithography, which produced uniform particle sizes (20 (+-) 1 nm) and uniform interparticle distances (150 (+-) 1 nm). TEM studies procvided information about the array periodicity; particle dimensions, and crystallinity of individual particles. Before heat treatments, individual Pt nanoparticles were found to be polycrystalline with crystalline domain sizes of 4-8 nm. After heating to 1000 K in high vacuum (10~7 Torr) and 1 atm H_2, the crystalline domain sizes within individual particles grew larger, without noticeable deformation of the array. A similar enlargement of crystalline domains was seen in 1 atm O_2 at a lower temperature of 700 K. Using contact mode AFM, the height, periodicity, and adhesion of the particles were determined. On a newly prepared sample, Pt particles were displaced from the silica support by the AFM tip with approximately 10 nN lateral force. The interfacial adhesion energy between the Pt and SiO_2 was on the order of 1 mJ/m~2, which is relatively weak bonding. After heating, the Pt particles could not be displaced by the AFM tip, suggesting that heat treatments had increased the bondig between the Pt and SiO_2. The stability and uniformity of the nanoparticle arrays make them ideal model catalysts for reactions in either oxidizing or reducing conditions.
机译:已经用透射电子显微镜(TEM)和原子力显微镜(AFM)测量了负载在二氧化硅上的Pt纳米颗粒的热,化学和机械稳定性。使用电子束光刻制造纳米颗粒阵列,其产生均匀的粒径(20(±)1 nm)和均匀的粒子间距离(150(±)1 nm)。 TEM研究提供了有关阵列周期性的信息。颗粒尺寸和单个颗粒的结晶度。在热处理之前,发现单个的Pt纳米颗粒是具有4-8 nm晶畴尺寸的多晶。在高真空(10〜7 Torr)和1 atm H_2下加热到1000 K之后,单个颗粒内的晶畴尺寸变大,而阵列没有明显变形。在较低的700 K温度下,在1 atm O_2中观察到类似的晶畴增大。使用接触模式AFM,确定了颗粒的高度,周期性和粘附性。在新制备的样品上,Pt颗粒通过AFM尖端以大约10 nN的侧向力从二氧化硅载体上移位。 Pt与SiO_2之间的界面附着能约为1 mJ / m〜2,相对较弱。加热后,Pt颗粒不能被AFM尖端置换,这表明热处理增加了Pt和SiO_2之间的结合力。纳米颗粒阵列的稳定性和均匀性使其成为在氧化或还原条件下反应的理想模型催化剂。

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