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Ab Initio Study of the Photochemical Decomposition Mechanism of Sulfonium Compounds, a Photoacid Generator

机译:从头开始研究光酸产生剂S化合物的光化学分解机理

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The photochemical decomposition mechanism of sulfonium compounds, an important photoacid generator (PAG) in lithography, was extensively studied by ab initio quantum chemical research. The homolytic bond cleavage takes place in the lowest triplet state T↓(1) as well as the lowest excited singlet state S↓(1)at the initial stage of the decomposition reaction, but the final products from S↓(1) are those generated from the heterolytic bond cleavage. The homolytic reaction is maintained from the initial stage to the final products only in the lowest triplet state T↓(1). In the ground state So, the heterolytic bond cleavage occurs at the initial stage, but the final products are those from the homolytic bond cleavage. SDTQ-CI calculations revealed that this mysterious phenomenon is explained as the results generated from the mixing of the lowest excited singlet state S1 and the ground state S↓(0). It was concluded that homolytic bond cleavage is the predominant mechanism in the resist films of lithography. The theoretically obtained results were compared with experiment.
机译:从头进行量子化学研究,对光刻中重要的光酸产生剂(PAG)compounds化合物的光化学分解机理进行了广泛的研究。在分解反应的初始阶段,均聚物键裂解发生在最低的三重态T↓(1)和最低的激发单重态S↓(1),但最终的S↓(1)是由杂合键裂解产生。从起始阶段到最终产物的均相反应仅在最低的三重态T↓(1)下得以维持。在基态So中,杂合键裂解发生在初始阶段,但最终产物是来自均质键裂解的产物。 SDTQ-CI计算表明,这种神秘现象可以解释为最低激发单重态S1和基态S↓(0)混合产生的结果。得出的结论是,均相键裂解是光刻胶膜中的主要机理。将理论上获得的结果与实验进行比较。

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