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Reaction of HF molecules with metal impurities on Si surfaces

机译:HF分子与Si表面的金属杂质反应

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摘要

First-principles quantum chemical calculations have been performed to reveal the reaction mechanisms of HF molecules with metal impurities (Al or Cu) on Si surfaces. The lowest energy paths of this HF attack reaction have been obtained in two situations when a metal atom adheres to a Si surface with and without an O atom incorporated between the metal atom and the surface. The potential energy changes along these reaction paths were evaluated. It was revealed that a HF molecule has the ability to etch an Al monoxide on the Si surface. On the other hand, HF is not effective in the etching of a metal atom (Al or Cu) which has directly bonded to a Si surface.
机译:已经进行了第一性原理量子化学计算,以揭示HF分子与Si表面上的金属杂质(Al或Cu)的反应机理。当金属原子附着在Si表面上且在金属原子和表面之间不包含O原子的情况下,在两种情况下均可获得此HF进攻反应的最低能级。评估了沿着这些反应路径的势能变化。揭示了HF分子具有在Si表面上蚀刻一氧化铝的能力。另一方面,HF对直接结合到Si表面的金属原子(Al或Cu)的蚀刻无效。

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