Dielectric Science & Technology Division Thomas D. Callinan Award and the Electronics and Photonics Division Award

摘要

Durgamadhab (Durga) Misra, professor and Associate Chair for Graduate Programs in the Department of Electrical and Computer Engineering at New Jersey Inst of Technology (NUT), has contributed significantly to research in low power MOSFETs, especially in the field of gate dielectric reliability. His recent work on high-k gate stack reliability, especially the contribution of various layers to the entire gate stack breakdown, received considerable recognition. He is an ECS Fellow.