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The effect of fluid inclusion size on determination of homogenization temperatue and density of liquid-rich aqueous inclusions

机译:流体包裹体尺寸对均质温度和富含液体的含水包裹体密度测定的影响

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Homogenization temperature variations of several degrees Celsius or more are often observed within a group of fluid inclusions that appear to have all trapped the same homogeneous fluid at the same time and presumably at the same PTX conditions. For inclusions that homogenize at T ≤ ≈230 °C, much of the observed variation can be attributed to the size of the inclusions. Larger inclusions homogenize at higher temperatures compared to smaller inclusions with the same density. The relationship between inclusion size and observed homogenization temperature is predicted by the Young-Laplace equation that relates the stability of a vapor bubble to the surface tension and pressure differential across the vapor-liquid interface. Vapor bubbles instantaneously collapse when the vapor bubble radius becomes less than the critical radius. During heating the critical radius of the vapor bubble is achieved at a lower temperature in the smaller inclusions. The critical vapor bubble radius varies from about 0.01 to ~3 μm for low-temperature aqueous fluid inclusions. The Gibbs surface free energy associated with the growth and collapse of vapor bubbles in pure H2O inclusions with critical radii ranging from 0.01 to 1 μm ranges from about 10–18 to 10–13 J/m2 and increases with both increasing critical vapor bubble radius and homogenization temperature. As a result of surface tension effects, the highest measured homogenization temperature, obtained from the largest inclusion in the group of coeval inclusions, most closely approximate the homogenization temperature that would be expected based on the inclu-sion density. For inclusions ranging from a few to several tens of micrometers in diameter and having densities such that the homogenization temperatures are approximately <230 °C, homogenization temperatures may vary by about 1–3 °C, depending on the inclusion size.
机译:经常在一组流体包裹体中观察到几摄氏度或更高的均质温度变化,这些流体包裹体似乎都在同一时间并且大概在相同的PTX条件下捕获了相同的均质流体。对于在T≤≈230°C下均质的夹杂物,观察到的大部分变化可归因于夹杂物的大小。与相同密度的较小夹杂物相比,较大的夹杂物在较高的温度下均质化。内含物尺寸与观察到的均质温度之间的关系是由Young-Laplace方程预测的,该方程将蒸气气泡的稳定性与气液界面上的表面张力和压力差相关联。当蒸气泡半径小于临界半径时,蒸气泡会瞬间崩溃。在加热过程中,较小的夹杂物在较低的温度下达到了气泡的临界半径。对于低温含水流体夹杂物,临界蒸气气泡半径在约0.01至约3μm之间变化。临界半径为0.01至1μm的纯H2O夹杂物中与气泡生长和破裂有关的吉布斯表面自由能在10–18至10–13 J / m2范围内,并且随着临界气泡半径和均质温度。作为表面张力效应的结果,从同代夹杂物组中最大的夹杂物获得的最高测得的均匀化温度最接近基于包含密度预期的均匀化温度。对于直径范围从几微米到几十微米的夹杂物,其密度使得均质化温度约为<230°C,根据夹杂物的大小,均质化温度可能会变化1-3°C。

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