Spectral characteristics of nanometer-thick chromium films in terahertz frequency range

摘要

The spectral characteristics (reflection, transmission, and absorption coefficients) of thin chromium films on silica substrates have been measured using a pulsed source of terahertz radiation. The spectra of optical coefficients were obtained in a frequency range of 0.25-1.1 THz. Dependences of the optical coefficients on the metal film thickness at 1 THz were constructed. The maximum absorption coefficient (43%) was observed at a film thickness of 10 nm.