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首页> 外文期刊>Pure and Applied Chemistry >A STATISTICAL OVERVIEW OF STANDARD (IUPAC AND ACS) AND NEW PROCEDURES FOR DETERMINING THE LIMITS OF DETECTION AND QUANTIFICATION - APPLICATION TO VOLTAMMETRIC AND STRIPPING TECHNIQUES (TECHNICAL REPORT)
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A STATISTICAL OVERVIEW OF STANDARD (IUPAC AND ACS) AND NEW PROCEDURES FOR DETERMINING THE LIMITS OF DETECTION AND QUANTIFICATION - APPLICATION TO VOLTAMMETRIC AND STRIPPING TECHNIQUES (TECHNICAL REPORT)

机译:标准(IUPAC和ACS)的统计概述以及确定检测和定量极限的新程序-应用于伏安和抽提技术(技术报告)

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摘要

Traditional methods for determining the limit of detection (LOD) and the limit of quantification (LOQ), based on the IUPAC and ACS definitions, often are unsatisfactory. Consequently, a new, simple and statistically correct way of obtaining both the LOD and LOQ values has been derived and compared to commonly used methods. The new Upper Limit Approach, ULA, calculates the upper confidence limit of an individual blank signal using a critical value of the t- distribution and standard error of estimate (residual standard deviation) of regression. The uncertainty of the calibration plot position, its intercept and the mean blank signal are taken also into consideration. The proper choice of calibration model and calibration design also are discussed in detail. An improved derivation of the signal value relevant to the LOQ is based on the use of the same significance level needed for defining the LOD. The concepts developed in this paper have been applied to the determination of cadmium by five common techniques of electrochemical trace analysis (d.c. tast polarography, differential pulse polarography, linear sweep stripping voltammetry, differential pulse stripping voltammetry, and potentiometric stripping analysis) under equivalent (as possible) conditions. The lowest LOD and LOQ values, obtained by the new reliable ULA method, were 1.0x10(-9) mol/L and 3.1x10(-9) mol/L Cd, resp., for differential pulse stripping voltammetry and significance level alpha=0.01. The relevant LOD and LOQ values for alpha=0.05 are 6.6x10(-10) mol/L and 2.0x10(-9) mol/L Cd, resp. Potentiometric stripping analysis provided similar results. [References: 58]
机译:基于IUPAC和ACS定义的确定检测限(LOD)和定量限(LOQ)的传统方法通常不能令人满意。因此,已经获得了一种既可以获取LOD值又可以获取LOQ值的简单,统计正确的新方法,并将其与常用方法进行了比较。新的上限方法ULA使用t分布的临界值和回归估计的标准误差(残差标准偏差)来计算单个空白信号的置信上限。还考虑了校准图位置,其截距和平均空白信号的不确定性。还详细讨论了校准模型和校准设计的正确选择。与LOQ相关的信号值的改进推导基于使用定义LOD所需的相同显着性水平。本文开发的概念已通过当量为(as)时的五种常见的电化学痕量分析技术(直流味觉极谱法,差分脉冲极谱法,线性扫描溶出伏安法,差分脉冲溶出伏安法和电位溶出分析)应用于镉的测定。可能)条件。通过新的可靠的ULA方法获得的最低LOD和LOQ值分别为1.0x10(-9)mol / L和3.1x10(-9)mol / L Cd,分别用于差分脉冲溶出伏安法和显着性水平alpha = 0.01。 alpha = 0.05的相关LOD和LOQ值分别为6.6x10(-10)mol / L和2.0x10(-9)mol / L Cd。电位剥离分析提供了相似的结果。 [参考:58]

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