Semi-quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers

摘要

An adequate qualification of concentrator photovoltaic solar cells and cell-on-carriers is essential to increase their industrial development. The lack of qualification tests for measuring their reliability together with the fact that conventional accelerated life tests are laborious and time consuming are open issues. Accordingly, in this paper, we propose a semi-quantitative temperature-accelerated life test to qualify solar cells and cell-on-carriers that can assure a minimum life when failure mechanisms are accelerated by temperature under emulated nominal working conditions with an activation energy >0.9 eV. A properly designed semi-quantitative accelerated life test should be able to determine if the device under test will satisfy its reliability requirements with an acceptable uncertainty level. The applicability, procedure, and design of the proposed test are detailed in the paper. Copyright (C) 2015 John Wiley & Sons, Ltd.