Structural Study of Semi-Crystalline Fibers during, deformation via synchrotron saxs technique

摘要

Two-dimensional small-angle x-ray scattering(SAXS) measurements using pin-hole cqllimation have been used quite routinely to investigate the two-phase morphology of polymer fibers since 1960 [3-3]. Although all the mprphologicai variables (such as long period, thickness, width and misorienl;anon) are Imbedded iri the 2-D pattern in reciprocal space, typical 1-p; analysis can not extract most information except the long period. In this work, it is our objective to demonstrate a straightforward -method that can be used to estimate the lamellar thickness for SAXS patterns having discrete scattering maximum ne^rprat the meridian. This method is subsequently applied to analyze the results from on-line measurement during fiber defomiation using synchrotron x-rays. We also will discuss the effect of misorientation in scatterers.