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Role of structural modification on the electrical properties of poly(ethylene terephthalate) irradiated with 90-MeV carbon ion beam

机译:结构修饰对90MeV碳离子束辐照的聚对苯二甲酸乙二醇酯电性能的作用

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摘要

Thin films of poly(ethylene terephthalate) (PET) having a thickness of 100 mu m were exposed to different ion fluence of swift heavy ions of carbon in the range of 5 X 10(11) - 5 x 10(13) ions/cm(2). The effect of ion beam on structural and electrical modification has been studied by UV/vis, FTIR, X-ray diffraction (XRD), Differential Scanning Calorimetery (DSC), and AC electrical measurement techniques. On irradiation, a shift in absorption wavelength toward the red end of spectrum with increase of ion fluence was observed. The intensity of crystalline IR bands and main diffraction peak in XRD pattern were found to decrease with increase in ion fluence. It indicates the loss of crystallinity induced by ion-beam irradiation. The crystallite size was found to increase on irradiation. The melting temperature (T-m) of PET films increased at a low ion dose (5.0 x 10(12) ions/cm(2)), while it decreased at higher ion fluence (50.0 x 10(12) ions/cm(2)). The dielectric constant (epsilon') of PET films was increased with increase of ion fluence. The modifications brought about in the dielectric constant are correlated with chemical and molecular structural changes occurring on irradiation.
机译:将厚度为100微米的聚对苯二甲酸乙二醇酯(PET)薄膜暴露于5 X 10(11)-5 x 10(13)离子/ cm范围内的快速重碳离子的不同离子通量下(2)。离子束对结构和电改性的影响已通过UV / vis,FTIR,X射线衍射(XRD),差示扫描量热法(DSC)和交流电测量技术进行了研究。照射时,观察到随着离子通量的增加,吸收波长向光谱的红色端移动。发现随着离子通量的增加,X射线衍射图谱中的晶体IR带强度和主要衍射峰减小。它表明由离子束辐照引起的结晶度损失。发现微晶尺寸在照射时增加。 PET膜的熔融温度(Tm)在低离子剂量(5.0 x 10(12)离子/ cm(2))时升高,而在较高离子通量(50.0 x 10(12)离子/ cm(2))时降低。 )。随着离子注量的增加,PET薄膜的介电常数(ε)增加。介电常数的变化与辐射时发生的化学和分子结构变化有关。

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