首页> 外文期刊>Polyhedron: The International Journal for Inorganic and Organometallic Chemistry >(X)over-tilde(3)Sigma(-) and (A)over-tilde (3)Pi electronic states of linear disilaketenylidene (SiSiO): analysis of the Renner effect in the (A)over-tilde (3)Pi state. Comparison with the analogous multiple bonded systems SiCO, CSiO, and CCO
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(X)over-tilde(3)Sigma(-) and (A)over-tilde (3)Pi electronic states of linear disilaketenylidene (SiSiO): analysis of the Renner effect in the (A)over-tilde (3)Pi state. Comparison with the analogous multiple bonded systems SiCO, CSiO, and CCO

机译:(X)叠峰(3)Sigma(-)和(A)叠峰(3)线性二硅烯酮亚基(SiSiO)的Pi电子态:分析(A)叠峰(3)Pi中的Renner效应州。与类似的多重键合系统SiCO,CSiO和CCO的比较

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Ab initio electronic structure theory has been employed to investigate systematically the (X) over tilde (3)Sigma(-) and (A) over tilde (3)Pi electronic states of linear disilaketenylidene (SiSiO). The ground state displays a SiSi double bond while the excited T In state may be assigned a SiSi bond order of 5/2. The ground ((X) over tilde (3)Sigma(-)) state of SiSiO possesses a real degenerate bending vibrational frequency, while the first excited triplet ((A) over tilde (3)Pi) state is subject to the Renner-Teller interaction, resulting in two distinct real vibrational frequencies along the bending coordinate. The total energies and physical properties including equilibrium geometries, dipole moments, harmonic vibrational frequencies, and associated infrared (IR) intensities of the two lowest-lying triplet states were predicted using the SCF, CISD, CCSD, and CCSD(T) levels of theory with a wide range of basis sets. The (A) over tilde (3)Pi state was also studied using the equation-of-motion CCSD (EOM-CCSD) technique in order to avoid a possible variational collapse to the lower-lying state. With the cc-pVTZ EOM-CCSD method, the Renner parameter and average harmonic bending vibrational frequency for the (A) over tilde (3)Pi state were determined to be epsilon = -0.078 and omega(2) = 219 cm(-1), respectively. With our most reliable method, cc-pVQZ CCSD(T), the (X) over tilde-(A) over tilde splitting (T-e value) of SiSiO was predicted to be 55.7 kcal mol(-1) (2.41 eV, 19 500 cm(-1)) and the splitting including zero-point vibrational energy correction (T-0 value) to be 56.1 kcal mol(-1) (2.43 eV, 19600 cm(-1)). The bond energy for Si-SiO was determined to be D-e = 26.1 (D-0 = 25.2) kcal mol(-1) indicating considerable thermodynamic stability for the ground state of SiSiO against the dissociation reaction SiSiO ((X) over tilde (3)Sigma(-)) --> Si (P-3(g)) + SiO ((X) over tilde (1)Sigma(+)). (C) 2002 Published by Elsevier Science Ltd. [References: 51]
机译:从头算电子结构理论已被用于系统地研究线性二硅烯基亚乙烯基(SiSiO)上的(X)代字号(3)Sigma(-)和(A)代字号(3)Pi的电子态。基态显示出SiSi双键,而激发的T In状态可以指定为5/2的SiSi键序。 SiSiO的基态((X)超过波浪线(3)Sigma(-))具有真实的简并弯曲振动频率,而第一个激发三重态((A)超过波浪线(3)Pi)处于Renner-柜员相互作用,沿弯曲坐标产生两个不同的真实振动频率。使用SCF,CISD,CCSD和CCSD(T)的理论水平预测了两个最低三重态的总能量和物理性质,包括平衡几何形状,偶极矩,谐波振动频率以及相关的红外(IR)强度。具有广泛的基础集。还使用运动方程式CCSD(EOM-CCSD)技术研究了波浪号(3)Pi的(A)状态,以避免可能发生的变化塌陷到较低的状态。使用cc-pVTZ EOM-CCSD方法,确定(A)在波浪号(3)Pi上的Renner参数和平均谐波弯曲振动频率为epsilon = -0.078和omega(2)= 219 cm(-1) ), 分别。使用我们最可靠的方法cc-pVQZ CCSD(T),预测SiSiO的在tilde上的(X)-在tilde分裂上的(A)(Te值)为55.7 kcal mol(-1)(2.41 eV,19 500 cm(-1))和包括零点振动能校正(T-0值)的拆分为56.1 kcal mol(-1)(2.43 eV,19600 cm(-1))。 Si-SiO的键能被确定为De = 26.1(D-0 = 25.2)kcal mol(-1),表明SiSiO的基态对解化反应SiSiO((X)在波浪号(3)上具有相当大的热力学稳定性(3) )Sigma(-))-> Si(P-3(g))+ SiO((X)乘以波浪号(1)Sigma(+))。 (C)2002由Elsevier Science Ltd.发布[参考:51]

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