Structure, magnetic and electrical properties of soft magnetic Co-C amorphous thin films

摘要

Amorphous CoxC1-x thin films, with x in the range of 60-75% in atomic percentage, have been prepared by pulsed filtered vacuum arc deposition. The structures of the films were characterized by transmission electron microscopy, X-ray diffraction, and X-ray photoelectron spectroscopy. The in-plane magnetic hysteresis loops were measured by a superconducting quantum interference device magnetometer at room temperature. The electrical transport properties were measured by the four-probe technique at various temperatures ranging from 20 to 300 K. The films were found to be magnetically soft with coercivities in the range of 2 to 12 Oe, resistivities in the range of 130 to 300 muOmega cm, and magnetic saturation flux densities in the range of 6 to 13 kG. The films also showed good thermal stability in their structural, electrical and magnetic properties upon annealing up to 200 degreesC in a vacuum furnace. (C) 2003 Elsevier B.V. All rights reserved. [References: 18]