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机译:完整14nm FinFET SRAM的参数和功能退化分析
Delft Univ Technol, Dept Comp Engn, NL-2628 CD Delft, Netherlands;
Delft Univ Technol, Dept Comp Engn, NL-2628 CD Delft, Netherlands;
Delft Univ Technol, Dept Comp Engn, NL-2628 CD Delft, Netherlands;
Delft Univ Technol, Dept Comp Engn, NL-2628 CD Delft, Netherlands;
Imec, Interuniv Microelect Ctr, Circuit & Device Architecture Future Scaled CMOS, B-3001 Leuven, Belgium;
Imec, Interuniv Microelect Ctr, Circuit Design RRAM, STT MRAM, B-3001 Leuven, Belgium;
Imec, Interuniv Microelect Ctr, Syst Div, High Level & Syst Synth Tech & Architectural Meth, B-3001 Leuven, Belgium|Imec, B-3001 Leuven, Belgium|Katholieke Univ Leuven, ESAT, B-3001 Leuven, Belgium;
Aging; bias temperature instability (BTI); FinFET; reliability; SRAM;
机译:完整14纳米FINFET SRAM的参数和功能性降解分析
机译:14nm FinFET中的TID工艺,几何和偏置条件相关性分析以及对RF和SRAM性能的影响
机译:基于14μnmFinFET的6T SRAM单元功能的性能评估,用于直流和瞬态电路分析
机译:高性能14nm FinFET SRAM的性能下降分析
机译:基于7NM FinFET的6T SRAM细胞瞬态和DC分析性能分析
机译:体硅衬底上的新型14nm扇贝形FinFET(S-FinFET)
机译:基于14个基于FinFET的6T SRAM细胞功能进行DC和瞬态电路分析的性能评估