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首页> 外文期刊>Thin Solid Films >The effect of poly (N-vinylpyrrolidone) molecular weight on flash light sintering of copper nanopaste
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The effect of poly (N-vinylpyrrolidone) molecular weight on flash light sintering of copper nanopaste

机译:聚(N-乙烯基吡咯烷酮)分子量对铜纳米浆料闪光烧结的影响

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摘要

The effect of poly (N-vinylpyrrolidone) (PVP) molecular weight (MW) on the flash light sintering of copper nanopaste was investigated. The copper nanopaste was coated on polyimide substrates using doctor blade method. PVP was used as reducing agent to functionalize the copper nanoparticles during flash light sintering process. To find the optimum sintering conditions of copper nanoparticles, the various MWs of PVP (10 000, 40 000 and 55 000) were used and the flash light irradiation energy was varied from 7.5 J/cm~2 to 17.5 J/cm~2. Meanwhile, other flash light irradiation conditions (pulse numbers, on-time and off-time durations) and amounts of PVP were fixed to clarify the effect of the PVP MW. As the results, it was found that flash light sintered copper nanofilms have the resistivity of 54 μΩcm without any damages to the polymer substrate. To characterize the microstructures and transformation crystal phase of the sintered copper nanofilms, scanning electron microscopy and X-ray diffraction were conducted. In order to understand the interaction between oxidized copper and PVP, X-ray photoelectron spectroscopy was analyzed. To observe the electrical conductivity of flash light sintered copper nanofilms, the sheet resistance of the sintered copper nanofilms was measured using a four-point probe method and the sheet resistance changes during the flash light irradiation process were monitored using in-situ monitoring system.
机译:研究了聚(N-乙烯基吡咯烷酮)(PVP)分子量(MW)对铜纳米浆料闪光烧结的影响。使用刮刀法将铜纳米糊剂涂覆在聚酰亚胺基底上。在闪光灯烧结过程中,PVP被用作还原剂以使铜纳米粒子功能化。为了找到铜纳米粒子的最佳烧结条件,使用了各种分子量的PVP(10000、40 000和55 000),闪光灯的照射能量在7.5 J / cm〜2到17.5 J / cm〜2之间变化。同时,固定了其他闪光灯照射条件(脉冲数,打开时间和关闭时间)和PVP量,以阐明PVP MW的效果。结果,发现闪光烧结的铜纳米膜具有54μΩcm的电阻率,而对聚合物基板没有任何损坏。为了表征烧结的铜纳米膜的微观结构和相变晶相,进行了扫描电子显微镜和X射线衍射。为了了解氧化铜与PVP之间的相互作用,分析了X射线光电子能谱。为了观察闪光烧结的铜纳米膜的电导率,使用四点探针法测量烧结的铜纳米膜的薄层电阻,并使用原位监测系统监测闪光照射过程中的薄层电阻变化。

著录项

  • 来源
    《Thin Solid Films》 |2014年第ptaa期|114-122|共9页
  • 作者单位

    Energy Nano Materials Research Center, Korea Electronics Technology Institute, 25, Saenari-ro, Bundang-gu, Seongnam-si, Gyeonggi-do 463-816, South Korea;

    Department of Mechanical Convergence Engineering, Hanyang University, Haengdang-dong, Seongdong-gu, Seoul 133-791, South Korea;

    Department of Mechanical Convergence Engineering, Hanyang University, Haengdang-dong, Seongdong-gu, Seoul 133-791, South Korea;

    Department of Mechanical Convergence Engineering, Hanyang University, Haengdang-dong, Seongdong-gu, Seoul 133-791, South Korea,Institute of Nano Science and Technology, Hanyang University, Seoul 133-791, South Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Printed electronics; Poly(N-vinylpyrrolidone); Molecular weight; Flash light sintering; In-situ monitoring; Copper; Nanoparticles;

    机译:印刷电子产品;聚(N-乙烯基吡咯烷酮);分子量;闪光灯烧结;现场监测;铜;纳米粒子;

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