首页> 外文期刊>Thin Solid Films >The effect of gate dielectric deposition at different vacuum conditions on the field-effect mobility of pentacene based organic field-effect transistors
【24h】

The effect of gate dielectric deposition at different vacuum conditions on the field-effect mobility of pentacene based organic field-effect transistors

机译:不同真空条件下栅极电介质沉积对并五苯有机场效应晶体管场效应迁移率的影响

获取原文
获取原文并翻译 | 示例
           

摘要

Pentacene based organic field effect transistors with polyvinyl phenol gate dielectric are fabricated by controlling the dielectric surface energy and grain size of the firstmonolayer of pentacene. In thiswork, we introduce a novel approach to tune the surface energy of the polymer dielectric. This is performed by baking the polymer dielectric, polyvinyl phenol, at different vacuumconditions at 160 degrees C before the deposition of pentacene layer. After the deposition of pentacene, these devices exhibit dramatic improvement of carrier mobility and an extraordinary change in electrical characteristics. This includes an enhancement of carrier mobility as high as 400% increase from 0.53 cm(2)/Vs for low vacuum (high surface energy of the gate dielectric) to 2.02 cm(2)/Vs for high vacuum (low surface energy of the gate dielectric) baking of polyvinyl dielectric thin film. It has been observed from the atomic force microscopy that the carrier mobility has a one to one correspondence with the grain size of the first monolayer. That is the carrier mobility increases with the increase in grain size. This fact is further interpreted in terms of the trap limited transport model proposed by Horowitz et. al. (C) 2017 Elsevier B.V. All rights reserved.
机译:通过控制并五苯第一单层的介电表面能和晶粒尺寸来制造具有聚乙烯基苯酚栅极电介质的并五苯有机场效应晶体管。在这项工作中,我们介绍了一种新颖的方法来调节聚合物电介质的表面能。这是通过在并五苯层沉积之前在160摄氏度的不同真空条件下烘烤聚合物电介质聚乙烯基苯酚来执行的。在并五苯沉积之后,这些器件显示出载流子迁移率的显着提高和电特性的显着变化。这包括将载流子迁移率提高了400%,从低真空度(栅极电介质的高表面能)的0.53 cm(2)/ Vs增加到高真空度(栅极电介质的低表面能)的2.02 cm(2)/ Vs。栅极介电层)烘烤聚乙烯介电薄膜。从原子力显微镜观察到,载流子迁移率与第一单层的晶粒尺寸具有一对一的对应关系。也就是说,载流子迁移率随着晶粒尺寸的增加而增加。根据Horowitz等人提出的阱限制运输模型进一步解释了这一事实。等(C)2017 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号